Due to the advancement of modern chip designs, test strategies become one of the most important issues to reduce test costs. In this paper, we proposed a methodology and focus on the large test power dissipation and large test data volume. Our methodology can suppress the test power to avoid chip failures caused by large test power, and the methodology is also effective in reducing the test data volume and shift-in power. The proposed schemes and techniques are based on the selective test pattern compression. They can reduce considerable shift-in power by skipping the switching signal passing through long scan chains. The experimental results with ISCAS89 circuits demonstrate that our methodology can achieve a significant improvement in the reduction of shift-in power and test data volume. Our approach also supports multiple scan chains.
|Number of pages||14|
|Journal||International Journal of Electrical Engineering|
|State||Published - 1 Feb 2010|
- Low power
- Scan chain
- Test data volume