A method for determining the specific capacitance value of mesoscopic Josephson junctions

Sheng Shiuan Yeh, Kuan Wen Chen, Tao Hsiang Chung, Dai Yang Wu, Ming Chou Lin, Jyh Yang Wang, I. Lin Ho, Cen Shawn Wu, Watson Kuo, Chiidong Chen*

*Corresponding author for this work

Research output: Contribution to journalArticle

Abstract

An approach for precise determination of capacitance values and energy level spacing of mesoscopic Josephson junctions is proposed. Quantized levels arising from plasma oscillation manifest themselves in the current peaks in the current-voltage characteristics of a nearby probe Josephson junction. From peak spacing, the specific capacitance of aluminum junctions is determined to be 35 fF/μm2. In addition, magnetic field dependence of quantum states can be described quantitatively by a theory that takes the effect of field induced surface current into account.

Original languageEnglish
Article number232602
JournalApplied Physics Letters
Volume101
Issue number23
DOIs
StatePublished - 3 Dec 2012

Fingerprint Dive into the research topics of 'A method for determining the specific capacitance value of mesoscopic Josephson junctions'. Together they form a unique fingerprint.

  • Cite this

    Yeh, S. S., Chen, K. W., Chung, T. H., Wu, D. Y., Lin, M. C., Wang, J. Y., Ho, I. L., Wu, C. S., Kuo, W., & Chen, C. (2012). A method for determining the specific capacitance value of mesoscopic Josephson junctions. Applied Physics Letters, 101(23), [232602]. https://doi.org/10.1063/1.4769999