A low cost DPA-resistant 8-bit AES core based on ring oscillators

Hsing Ping Fu*, Ju Hung Hsiao, Po Chun Liu, Hsie-Chia Chang, Chen-Yi Lee

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

This work presents a 8-bit low cost AES core with DPA resistance for resource-limited applications. Based on our approach by using ring oscillators, the protection with no throughput penalty can effectively keep the design from DPA attacks. Both of the elegant control mechanism and logic sharing are employed to further reduce power consumption and area overhead. After implemented in UMC 90 nm CMOS technology, our approach costing 3.32K gates with 6.9% overhead can achieve 178Mb/s throughput and 201uW power consumption, showing that this design is comparable with other unprotected low cost designs. Furthermore, the countermeasure circuit protects the key information from DPA attack after evaluated by 15000 traces.

Original languageEnglish
Title of host publication2012 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2012 - Proceedings of Technical Papers
DOIs
StatePublished - 25 Jul 2012
Event2012 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2012 - Hsinchu, Taiwan
Duration: 23 Apr 201225 Apr 2012

Publication series

Name2012 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2012 - Proceedings of Technical Papers

Conference

Conference2012 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2012
CountryTaiwan
CityHsinchu
Period23/04/1225/04/12

Keywords

  • Advanced Encryption Standard(AES)
  • Differential Power Analysis(DPA)
  • hiding
  • ring oscillator

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    Fu, H. P., Hsiao, J. H., Liu, P. C., Chang, H-C., & Lee, C-Y. (2012). A low cost DPA-resistant 8-bit AES core based on ring oscillators. In 2012 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2012 - Proceedings of Technical Papers [6212665] (2012 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2012 - Proceedings of Technical Papers). https://doi.org/10.1109/VLSI-DAT.2012.6212665