A hybrid scheme for compacting test responses with unknown values

Chia-Tso Chao; Kwang Ting Cheng; Seongmoon Wang; Srimat T. Chakradhar; Wen Long Wei

doi:10.1109/ICCAD.2007.4397316

A hybrid scheme for compacting test responses with unknown values

Chia-Tso Chao, Kwang Ting Cheng, Seongmoon Wang, Srimat T. Chakradhar, Wen Long Wei

Department of Electronics Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

3 Scopus citations

Abstract

This paper presents a hybrid compaction scheme for test responses containing unknown values, which consists of a space compactor and an unknown-blocking Multiple Input Signature Registers (MISR). The proposed scheme guarantees no coverage loss for the modeled faults. The proposed hybrid scheme can also be tuned to observe any user-specified percentage of responses for controlling the coverage loss for un-modeled faults. The experimental results demonstrate that, in comparison with a space compactor or an unknown-blocking MISR alone, the hybrid compaction scheme achieves a lower coverage loss without demanding more test-data volume. In addition, we propose a quantitative approach to estimate the required percentage of observable responses for the proposed scheme, directly based on a test-quality metric of un-modeled faults.

Original language	English
Title of host publication	2007 IEEE/ACM International Conference on Computer-Aided Design, ICCAD
Pages	513-519
Number of pages	7
DOIs	https://doi.org/10.1109/ICCAD.2007.4397316
State	Published - 1 Dec 2007
Event	2007 IEEE/ACM International Conference on Computer-Aided Design, ICCAD - San Jose, CA, United States Duration: 4 Nov 2007 → 8 Nov 2007

Publication series

Name	IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
ISSN (Print)	1092-3152

Conference

Conference	2007 IEEE/ACM International Conference on Computer-Aided Design, ICCAD
Country	United States
City	San Jose, CA
Period	4/11/07 → 8/11/07

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Chao, C-T., Cheng, K. T., Wang, S., Chakradhar, S. T., & Wei, W. L. (2007). A hybrid scheme for compacting test responses with unknown values. In 2007 IEEE/ACM International Conference on Computer-Aided Design, ICCAD (pp. 513-519). [4397316] (IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD). https://doi.org/10.1109/ICCAD.2007.4397316

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title = "A hybrid scheme for compacting test responses with unknown values",

abstract = "This paper presents a hybrid compaction scheme for test responses containing unknown values, which consists of a space compactor and an unknown-blocking Multiple Input Signature Registers (MISR). The proposed scheme guarantees no coverage loss for the modeled faults. The proposed hybrid scheme can also be tuned to observe any user-specified percentage of responses for controlling the coverage loss for un-modeled faults. The experimental results demonstrate that, in comparison with a space compactor or an unknown-blocking MISR alone, the hybrid compaction scheme achieves a lower coverage loss without demanding more test-data volume. In addition, we propose a quantitative approach to estimate the required percentage of observable responses for the proposed scheme, directly based on a test-quality metric of un-modeled faults.",

author = "Chia-Tso Chao and Cheng, {Kwang Ting} and Seongmoon Wang and Chakradhar, {Srimat T.} and Wei, {Wen Long}",

year = "2007",

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doi = "10.1109/ICCAD.2007.4397316",

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series = "IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD",

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note = "null ; Conference date: 04-11-2007 Through 08-11-2007",

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Chao, C-T, Cheng, KT, Wang, S, Chakradhar, ST & Wei, WL 2007, A hybrid scheme for compacting test responses with unknown values. in 2007 IEEE/ACM International Conference on Computer-Aided Design, ICCAD., 4397316, IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD, pp. 513-519, 2007 IEEE/ACM International Conference on Computer-Aided Design, ICCAD, San Jose, CA, United States, 4/11/07. https://doi.org/10.1109/ICCAD.2007.4397316

A hybrid scheme for compacting test responses with unknown values. / Chao, Chia-Tso; Cheng, Kwang Ting; Wang, Seongmoon; Chakradhar, Srimat T.; Wei, Wen Long.

2007 IEEE/ACM International Conference on Computer-Aided Design, ICCAD. 2007. p. 513-519 4397316 (IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Chao, Chia-Tso

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AU - Wei, Wen Long

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N2 - This paper presents a hybrid compaction scheme for test responses containing unknown values, which consists of a space compactor and an unknown-blocking Multiple Input Signature Registers (MISR). The proposed scheme guarantees no coverage loss for the modeled faults. The proposed hybrid scheme can also be tuned to observe any user-specified percentage of responses for controlling the coverage loss for un-modeled faults. The experimental results demonstrate that, in comparison with a space compactor or an unknown-blocking MISR alone, the hybrid compaction scheme achieves a lower coverage loss without demanding more test-data volume. In addition, we propose a quantitative approach to estimate the required percentage of observable responses for the proposed scheme, directly based on a test-quality metric of un-modeled faults.

AB - This paper presents a hybrid compaction scheme for test responses containing unknown values, which consists of a space compactor and an unknown-blocking Multiple Input Signature Registers (MISR). The proposed scheme guarantees no coverage loss for the modeled faults. The proposed hybrid scheme can also be tuned to observe any user-specified percentage of responses for controlling the coverage loss for un-modeled faults. The experimental results demonstrate that, in comparison with a space compactor or an unknown-blocking MISR alone, the hybrid compaction scheme achieves a lower coverage loss without demanding more test-data volume. In addition, we propose a quantitative approach to estimate the required percentage of observable responses for the proposed scheme, directly based on a test-quality metric of un-modeled faults.

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BT - 2007 IEEE/ACM International Conference on Computer-Aided Design, ICCAD

Y2 - 4 November 2007 through 8 November 2007

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A hybrid scheme for compacting test responses with unknown values

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