A highly reliable NAND structure flash memory capable for low voltage operation

Y. C. Lin*, C. S. Lai, Steve S. Chung, Evans Yang, S. Pittikoun, S. M. Tzeng, C. C.H. Hsu

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

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Engineering & Materials Science