A fuzzy logic approach for incorporating the effects of managerialactions on semiconductoryield learning

Tin-Chih Chen*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Scopus citations

Abstract

The competition in the semiconductor industry is becoming more and more fierce, which significantly distorts the learning process of semiconductor yield improvement. For example, if the yield of a product could not reach a certain level before a given deadline, then the competitiveness of the product will disappear and capacity will be re-allocated to other products. To prevent that from happening, some managerial actions, e.g. executing a quality engineering project, quickening the speed of mass production, etc. can be taken to accelerate yield learning. After such actions, the yield learning model has to be modified. In this study, how to incorporate the effects of such managerial actions on semiconductor yield learning is investigated. Subsequently, a new fuzzy yield learning model is developed. The proposed methodology has been applied to the data of four semiconductor products. Experimental results revealed the effectiveness of the proposed methodology.

Original languageEnglish
Title of host publicationProceedings of the Sixth International Conference on Machine Learning and Cybernetics, ICMLC 2007
Pages1979-1984
Number of pages6
DOIs
StatePublished - 1 Dec 2007
Event6th International Conference on Machine Learning and Cybernetics, ICMLC 2007 - Hong Kong, China
Duration: 19 Aug 200722 Aug 2007

Publication series

NameProceedings of the Sixth International Conference on Machine Learning and Cybernetics, ICMLC 2007
Volume4

Conference

Conference6th International Conference on Machine Learning and Cybernetics, ICMLC 2007
CountryChina
CityHong Kong
Period19/08/0722/08/07

Keywords

  • Fuzzy logic
  • Learning model
  • Semiconductor
  • Yield

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    Chen, T-C. (2007). A fuzzy logic approach for incorporating the effects of managerialactions on semiconductoryield learning. In Proceedings of the Sixth International Conference on Machine Learning and Cybernetics, ICMLC 2007 (pp. 1979-1984). [4370471] (Proceedings of the Sixth International Conference on Machine Learning and Cybernetics, ICMLC 2007; Vol. 4). https://doi.org/10.1109/ICMLC.2007.4370471