A flexible TFT circuit yield optimizer considering process variation, aging, and bending effects

Wen En Wei*, Hung Yi Li, Cheng Yu Han, James Chien Mo Li, Jian Jang Huang, I. Chun Cheng, Chien-Nan Liu, Yung Hui Yeh

*Corresponding author for this work

Research output: Contribution to journalArticle

5 Scopus citations

Abstract

This paper presents a yield optimization tool, FlexiOptimizer , for flexible thin-film transistor (TFT) circuits. FlexiOptimizer considers three important effects: (1) process variation; (2) aging effect; and (3) bending effect. This SPICE-based optimizer applies response surface methodology (RSM) and orthogonal array (OA) techniques to size transistors so the yield is improved in aged and bent condition. This tool is demonstrated on two different designs: organic light emitting diode (OLED) pixel drivers and differential operational amplifiers (OPAMPs), in both amorphous silicon (a-Si) and Indium-Gallium-Zinc-Oxide (IGZO) TFT technologies.

Original languageEnglish
Article number6860224
Pages (from-to)1055-1063
Number of pages9
JournalIEEE/OSA Journal of Display Technology
Volume10
Issue number12
DOIs
StatePublished - 1 Dec 2014

Keywords

  • Analog circuit optimization
  • flexible TFT
  • orthogonal array
  • response surface methodology

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    Wei, W. E., Li, H. Y., Han, C. Y., Li, J. C. M., Huang, J. J., Cheng, I. C., Liu, C-N., & Yeh, Y. H. (2014). A flexible TFT circuit yield optimizer considering process variation, aging, and bending effects. IEEE/OSA Journal of Display Technology, 10(12), 1055-1063. [6860224]. https://doi.org/10.1109/JDT.2014.2340892