A FCM and embedded-BPN approach for job cycle time estimation in a wafer fabrication factory

Tin-Chih Chen*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

A fuzzy c-means (FCM) and embedded-back propagation network (embedded BPN) approach is proposed in this study for estimating the cycle time of a job in a wafer fabrication factory, which is a critical task to the wafer fabrication factory. Unlike the existing approaches in which job classification and cycle time estimation are separate stages, the proposed methodology classifies jobs and at the same time estimates the cycle times, which is an innovative treatment in this field. For evaluating the effectiveness of the proposed methodology, production simulation is also applied in this study to generate some test data.

Original languageEnglish
Pages (from-to)760-764
Number of pages5
JournalInternational Review on Computers and Software
Volume6
Issue number5
StatePublished - 1 Sep 2011

Keywords

  • Cycle time
  • Embedded
  • Fuzzy back propagation network
  • Fuzzy C-means
  • Wafer fabrication factory

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