A fast and sensitive built-in current sensor for IDDQ testing

Chih Wen Lu, Chung Len Lee, Jwu E. Chen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

17 Scopus citations

Abstract

In this work, a fast and highly sensitive Built-in Current (BIC) sensor is proposed for testing static CMOS ICs. The sensor employs a current mirror and an I-V converter to achieve the high sensing speed and high resolution. The circuit is simple and occupies a small area, making it ideal to be integrated into the IC chip for the IDDQ application.

Original languageEnglish
Title of host publicationDigest of Papers - 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996
EditorsCarol Tong, Anura Jayasuniana
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages56-58
Number of pages3
ISBN (Electronic)0818676558, 9780818676550
DOIs
StatePublished - 1996
Event1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996 - Washington, United States
Duration: 24 Oct 199625 Oct 1996

Publication series

NameDigest of Papers - 1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996

Conference

Conference1996 IEEE International Workshop on IDDQ Testing, IDDQ 1996
CountryUnited States
CityWashington
Period24/10/9625/10/96

Fingerprint Dive into the research topics of 'A fast and sensitive built-in current sensor for IDDQ testing'. Together they form a unique fingerprint.

Cite this