A Density Metric for Semiconductor Technology

H. S.Philip Wong*, Kerem Akarvardar, Dimitri Antoniadis, Jeffrey Bokor, Chenming Hu, Tsu Jae King-Liu, Subhasish Mitra, James D. Plummer, Sayeef Salahuddin

*Corresponding author for this work

Research output: Contribution to journalEditorial

Abstract

Since its inception, the semiconductor industry has used a physical dimension (the minimum gate length of a transistor) as a means to gauge continuous technology advancement. This metric is all but obsolete today. As a replacement, we propose a density metric, which aims to capture how advances in semiconductor device technologies enable system-level benefits. The proposed metric can be used to gauge advances in future generations of semi-conductor technologies in a holistic way, by accounting for the progress in logic, memory, and packaging/integration technologies simultaneously.

Original languageEnglish
Article number9063714
Pages (from-to)478-482
Number of pages5
JournalProceedings of the IEEE
Volume108
Issue number4
DOIs
StatePublished - Apr 2020

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