TY - JOUR
T1 - A Charge Conserving Non-Quasi-Static (NQS) MOSFET Model for SPICE Transient Analysis
AU - Park, Hong June
AU - Ko, Ping Keung
AU - Hu, Chen-Ming
PY - 1991/1/1
Y1 - 1991/1/1
N2 - An analytic charge conserving non-quasi-static (NQS) model has been derived for long channel MOSFET’s and has been implemented in SPICE3. The model is based on approximate solutions to the transient current continuity equation, and analytic equations have been derived for node charges using the charge-sheet formulation. The NQS effects in several test circuits which include a pass transistor, a CMOS inverter chain, and a differential sample-hold circuit, are simulated. Excellent agreements have been observed among this work, PISCES (2-D device simulation), the 1-D numerical simulation, the multiple lump model, and CODECS (a mixed device and circuit simulation). However, large differences have been observed between this work and conventional quasi-static (QS) models. The model computation time of this work implemented in SPICE3 is about 2–3 times larger than those of QS models (BSIM, Level-2 Meyer) in SPICE3.
AB - An analytic charge conserving non-quasi-static (NQS) model has been derived for long channel MOSFET’s and has been implemented in SPICE3. The model is based on approximate solutions to the transient current continuity equation, and analytic equations have been derived for node charges using the charge-sheet formulation. The NQS effects in several test circuits which include a pass transistor, a CMOS inverter chain, and a differential sample-hold circuit, are simulated. Excellent agreements have been observed among this work, PISCES (2-D device simulation), the 1-D numerical simulation, the multiple lump model, and CODECS (a mixed device and circuit simulation). However, large differences have been observed between this work and conventional quasi-static (QS) models. The model computation time of this work implemented in SPICE3 is about 2–3 times larger than those of QS models (BSIM, Level-2 Meyer) in SPICE3.
UR - http://www.scopus.com/inward/record.url?scp=0026156001&partnerID=8YFLogxK
U2 - 10.1109/43.79500
DO - 10.1109/43.79500
M3 - Article
AN - SCOPUS:0026156001
VL - 10
SP - 629
EP - 642
JO - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
JF - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
SN - 0278-0070
IS - 5
ER -