A Bayesian approach to obtain a lower bound for the C pm capability index

G. H. Lin*, W.l. Pearn, Y. S. Yang

*Corresponding author for this work

Research output: Contribution to journalArticle

12 Scopus citations

Abstract

The Taguchi capability index C pm, which incorporates the departure of the process mean from the target value, has been proposed to the manufacturing industry for measuring manufacturing capability. A Bayesian procedure has been considered for testing process performance assuming μ = T, which was generalized without assuming μ = T. Statistical properties of the natural estimator of the index C pm for normal processes have been investigated extensively. However, the investigation was restricted to processes with symmetric tolerances. Recently, a generalized C pm, referred to as C″ pm, was proposed to cover processes with asymmetric tolerances. Under the normality assumption, the statistical properties of the estimated C″ pm including the exact sampling distribution, the rth moment, expected value, variance, and the mean-squared error were obtained. In this paper, we use a Bayesian approach to obtain the interval estimation for the generalized Taguchi capability index C″ pm. Consequently, the manufacturing capability testing can be performed for quality assurance.

Original languageEnglish
Pages (from-to)655-668
Number of pages14
JournalQuality and Reliability Engineering International
Volume21
Issue number6
DOIs
StatePublished - 1 Oct 2005

Keywords

  • Asymmetric tolerances
  • Process capability index

Fingerprint Dive into the research topics of 'A Bayesian approach to obtain a lower bound for the C <sub>pm</sub> capability index'. Together they form a unique fingerprint.

  • Cite this