A 40nm 1.0Mb pipeline 6T SRAM with variation-tolerant Step-Up Word-Line and Adaptive Data-Aware Write-Assist

Chi Shin Chang, Hao I. Yang, Wei Nan Liao, Yi Wei Lin, Nan Chun Lien, Chien Hen Chen, Ching Te Chuang, Wei Hwang, Shyh-Jye Jou, Ming Hsien Tu, Huan Shun Huang, Yong Jyun Hu, Paul Sen Kan, Cheng Yo Cheng, Wei Chang Wang, Jian Hao Wang, Kuen Di Lee, Chia Cheng Chen, Wei Chiang Shih

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

We present a 1.0Mb pipeline 6T SRAM in 40nm Low-Power CMOS technology. The design employs a variation-tolerant Step-Up Word-Line (SUWL) to improve the Read Static Noise Margin (RSNM) without compromising the Read performance and Write-ability. The Write-ability is further enhanced by an Adaptive Data-Aware Write-Assist (ADAWA) scheme. The 1.0Mb test chip operates from 1.5V to 0.7V, with operating frequency of 800MHz@1.2V and 25°C. The measured power consumption is 23.21mW (Active)/2.42mW (Leakage) at 1.2V, TT, 25°C; and 6.01mW (Active)/0.35mW (Leakage) at 0.7V, TT, 25°C.

Original languageEnglish
Title of host publication2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013
Pages1468-1471
Number of pages4
DOIs
StatePublished - 9 Sep 2013
Event2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013 - Beijing, China
Duration: 19 May 201323 May 2013

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
ISSN (Print)0271-4310

Conference

Conference2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013
CountryChina
CityBeijing
Period19/05/1323/05/13

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  • Cite this

    Chang, C. S., Yang, H. I., Liao, W. N., Lin, Y. W., Lien, N. C., Chen, C. H., Chuang, C. T., Hwang, W., Jou, S-J., Tu, M. H., Huang, H. S., Hu, Y. J., Kan, P. S., Cheng, C. Y., Wang, W. C., Wang, J. H., Lee, K. D., Chen, C. C., & Shih, W. C. (2013). A 40nm 1.0Mb pipeline 6T SRAM with variation-tolerant Step-Up Word-Line and Adaptive Data-Aware Write-Assist. In 2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013 (pp. 1468-1471). [6572134] (Proceedings - IEEE International Symposium on Circuits and Systems). https://doi.org/10.1109/ISCAS.2013.6572134