A 10-Gb/s laser diode driver in 0.35 μm BiCMOS technology

Teng Yi Wang*, Wei-Zen Chen, Chia-Ming Tsai, Li Ren Huang, Day Uei Li

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

This paper describes the design of a 10Gb/s laser diode (LD) driver in a 0.35μm SiGe BiCMOS technology. The LD driver delivers a biased current up to 60 mA, and a modulation current ranges from 40 mA to 100 mA. High speed operation as well as high current driving capability are achieved by means of push-pull current switching scheme. In addition, negative Miller capacitor compensation technique is adopted to enhance the signal bandwidth. The output swing of the predriver is dynamically adjustable to compromise between operating speed and overshoot. Both the modulation and biased currents are derived from a bandgap reference source. The measured rise/fall time is 47ps, and timing jitter is 22.2psp-p. The eye diagrams meet the specifications defined by SONET OC-192 and 10G Ethernet eye mask. Operating under 3.3V/7V supply, the total power consumption is 1.38W. Chip size is 1430 × 940 μm 2.

Original languageEnglish
Title of host publication2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)
Pages253-256
Number of pages4
DOIs
StatePublished - 1 Dec 2005
Event2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT) - Hsinchu, Taiwan
Duration: 27 Apr 200529 Apr 2005

Publication series

Name2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)
Volume2005

Conference

Conference2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT)
CountryTaiwan
CityHsinchu
Period27/04/0529/04/05

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  • Cite this

    Wang, T. Y., Chen, W-Z., Tsai, C-M., Huang, L. R., & Li, D. U. (2005). A 10-Gb/s laser diode driver in 0.35 μm BiCMOS technology. In 2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT) (pp. 253-256). [1500068] (2005 IEEE VLSI-TSA International Symposium on VLSI Design, Automation and Test,(VLSI-TSA-DAT); Vol. 2005). https://doi.org/10.1109/VDAT.2005.1500068