A 0.5V 1.27mW nose-on-a-chip for rapid diagnosis of ventilator-associated pneumonia

Kea Tiong Tang, Shih Wen Chiu, Chung Hung Shih, Chia Ling Chang, Chia Min Yang, Da Jeng Yao, Jen Huo Wang, Chien Ming Huang, Hsin Chen, Kwuang Han Chang, Chih Cheng Hsieh, Ting Hau Chang, Meng Fan Chang, Chia Min Wang, Yi Wen Liu, Tsan Jieh Chen, Chia Hsiang Yang, Her-Ming Chiueh, Jyuo Min Shyu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

15 Scopus citations

Abstract

Ventilator-associated pneumonia (VAP) is the most frequently acquired infection among patients that receive mechanical ventilation in the intensive-care unit (ICU). The mortality rate for VAP lies in the 20-to-50% range and could be even higher in some ICUs. A standard operation procedure to VAP treatment includes a sequence of chest radiography, sputum gram stain, sputum culture, and empiric therapy, initially with antibiotics covering broad pathogens. However, collection of the gram stain and culture of lower respiratory tract specimen is usually not time-efficient (up to 5 days), delaying the initiation of therapy and unacceptable for critically ill patients. A rapid and accurate diagnosis for VAP is therefore crucial, but still unavailable. It is known that microorganisms generate complex metabolites during infection. Fast detection is feasible by examining metabolic wastes in proximal end of the expiratory device, demanding a miniaturized, battery-powered, gas-sensing device. In this work, a fully integrated low-power nose-on-a-chip with a robust learning kernel is developed for such a vital clinical need.

Original languageEnglish
Title of host publication2014 IEEE International Solid-State Circuits Conference, ISSCC 2014 - Digest of Technical Papers
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages420-421
Number of pages2
ISBN (Print)9781479909186
DOIs
StatePublished - 1 Jan 2014
Event2014 61st IEEE International Solid-State Circuits Conference, ISSCC 2014 - San Francisco, CA, United States
Duration: 9 Feb 201413 Feb 2014

Publication series

NameDigest of Technical Papers - IEEE International Solid-State Circuits Conference
Volume57
ISSN (Print)0193-6530

Conference

Conference2014 61st IEEE International Solid-State Circuits Conference, ISSCC 2014
CountryUnited States
CitySan Francisco, CA
Period9/02/1413/02/14

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