1149.4 Based on-line quiescent state monitoring technique [analog DFT]

Chau-Chin Su, Chih Hu Wang, Wei Juo Wang, I. S. Tseng

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

On-line quiescent state monitoring is achieved by utilizing dual comparators compatible with the IEEE 1149.4 standard analog DFT. Statistical analysis is used to minimize the impacts of dynamic signals and noise carried in the signal line. The experimental results confirm the mathematical analysis and assure the test methodology.

Original languageEnglish
Title of host publicationProceedings - 21st IEEE VLSI Test Symposium, VTS 2003
PublisherIEEE Computer Society
Pages197-202
Number of pages6
ISBN (Electronic)0769519245
DOIs
StatePublished - 1 May 2003
Event21st IEEE VLSI Test Symposium, VTS 2003 - Napa Valley, United States
Duration: 27 Apr 20031 May 2003

Publication series

NameProceedings of the IEEE VLSI Test Symposium
Volume2003-January

Conference

Conference21st IEEE VLSI Test Symposium, VTS 2003
CountryUnited States
CityNapa Valley
Period27/04/031/05/03

Keywords

  • Circuit testing
  • Data communication
  • Digital signal processing
  • Mathematical analysis
  • Monitoring
  • Operational amplifiers
  • Radio frequency
  • Signal processing
  • Statistical analysis
  • System performance

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