0.18-V input charge pump with forward body biasing in startup circuit using 65nm CMOS

Po-Hung Chen*, Koichi Ishida, Xin Zhang, Yasuaki Okuma, Yoshikatsu Ryu, Makoto Takamiya, Takayasu Sakurai

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

57 Scopus citations

Abstract

In this paper, a 0.18-V input three-stage charge pump circuit applying forward body bias is proposed. In the developed charge pump, all the MOSFETs are forward body biased by using the inter-stage/output voltages. By applying the proposed charge pump as the startup in the boost converter, the lower kick-up input voltage of the boost converter can be achieved. To verify the circuit characteristics, four test circuits have been implemented by using 65nm CMOS process. The measured available output current of the proposed charge pump under 0.18-V input voltage can be improved more than 150%. In addition, the boost converter can successfully been boosted from 0.18-V input to the 0.74-V output under 6mA output current. The proposed circuit is suitable for extremely low voltage applications such as harvesting energy sources.

Original languageEnglish
Title of host publicationIEEE Custom Integrated Circuits Conference 2010, CICC 2010
DOIs
StatePublished - 13 Dec 2010
Event32nd Annual Custom Integrated Circuits Conference - The Showcase for Circuit Design in the Heart of Silicon Valley, CICC 2010 - San Jose, CA, United States
Duration: 19 Sep 201022 Sep 2010

Publication series

NameProceedings of the Custom Integrated Circuits Conference
ISSN (Print)0886-5930

Conference

Conference32nd Annual Custom Integrated Circuits Conference - The Showcase for Circuit Design in the Heart of Silicon Valley, CICC 2010
CountryUnited States
CitySan Jose, CA
Period19/09/1022/09/10

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  • Cite this

    Chen, P-H., Ishida, K., Zhang, X., Okuma, Y., Ryu, Y., Takamiya, M., & Sakurai, T. (2010). 0.18-V input charge pump with forward body biasing in startup circuit using 65nm CMOS. In IEEE Custom Integrated Circuits Conference 2010, CICC 2010 [5617444] (Proceedings of the Custom Integrated Circuits Conference). https://doi.org/10.1109/CICC.2010.5617444