試鏡架與試鏡架關鍵參數量測方法

Jen-Hui Chuang (Inventor)

Research output: Patent

Original languageChinese (Traditional)
Patent numberUS 10,130,252 B2
StatePublished - 20 Nov 2018

Cite this

Chuang, J-H. (2018). 試鏡架與試鏡架關鍵參數量測方法. (Patent No. US 10,130,252 B2).