相位雜訊量測電路

@misc{aa0212605fd1463b8521688640190b83,

title = "相位雜訊量測電路",

author = "Wei-Zen Chen",

year = "2017",

month = feb,

day = "21",

language = "Chinese (Traditional)",

type = "Patent",

note = "I571641",

}

Chen, W-Z Feb. 21 2017, 相位雜訊量測電路, Patent No. I571641.

相位雜訊量測電路. / Chen, Wei-Zen (Inventor).

Patent No.: I571641. Feb 21, 2017.

Research output: Patent

TY - PAT

T1 - 相位雜訊量測電路

AU - Chen, Wei-Zen

PY - 2017/2/21

Y1 - 2017/2/21

M3 - Patent

M1 - I571641

ER -

Chen W-Z, inventor. 相位雜訊量測電路. I571641. 2017 Feb 21.

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