半導體元件之參數萃取方法

Jyh-Chyurn Guo (Inventor)

Research output: Patent

Original languageChinese (Traditional)
Patent numberI430125
StatePublished - 11 Mar 2014

Cite this

Guo, J-C. (2014). 半導體元件之參數萃取方法. (Patent No. I430125).