Skip to main navigation
Skip to search
Skip to main content
English
中文
Home
Profiles
Research Units
Research output
Projects
Prizes
Activities
Equipment
Impacts
Search by expertise, name or affiliation
A Comprehensive Characterization and Modeling of Layout Dependent Effects and 3-D Parasitics for RF Performance and Broadband Noise in Planar Bulk and Multi-Gate Nanoscale Devices
郭, 治群
(PI)
Institute of Electronics
Overview
Project Details
Status
Finished
Effective start/end date
1/08/17
→
31/12/18
View all
View less