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Personal profile

Research Interests

Power GaN and SiC semiconductor devices, Sub-5 nm beyond CMOS, Reliability evaluation and degradation mechanism analysis, AI-assisted device design and reliability prediction in advanced semiconductor technologies

Experience

2011/6 ~ 2016/7 Ph.D. researcher, imec, Belgium

2016/1 ~ 2016/3 Visiting researcher, IBM, USA

2016/8 ~ 2017/1 Research Scientist, imec, Belgium

2017/2 ~ present Assistant Professor, International College of Semiconductor Technology, National Chiao Tung University

Education/Academic qualification

PhD, KU Leuven

External positions

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Projects

Research Output

Artificial Neural Network-Based (ANN) Approach for Characteristics Modeling and Prediction in GaN-on-Si Power Devices

Kutub, S. B., Jiang, H. J., Chen, N. Y., Lee, W. J., Jui, C. Y. & Wu, T. L., Sep 2020, Proceedings of the 2020 32nd International Symposium on Power Semiconductor Devices and ICs, ISPSD 2020. Institute of Electrical and Electronics Engineers Inc., p. 529-532 4 p. 9170110. (Proceedings of the International Symposium on Power Semiconductor Devices and ICs; vol. 2020-September).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • Effects of gamma-Ray Irradiation on AlGaN/GaN Heterostructures and High Electron Mobility Transistor Devices

    Sharma, C., Singh, R., Chao, D-S. & Wu, T-L., 18 Jul 2020, In : Journal of Electronic Materials. 9 p.

    Research output: Contribution to journalArticle

    Open Access

    Impact of the polarization on time-dependent dielectric breakdown in ferroelectric Hf0.5Zr0.5O2 on Ge substrates

    Yang, T. H., Su, C-J., Wang, Y. S., Kao, K. H., Lee, Y. J. & Wu, T-L., 1 Apr 2020, In : Japanese Journal of Applied Physics. 59, SG, SGGB08.

    Research output: Contribution to journalArticle

  • Improved TDDB Reliability and Interface States in 5-nm Hf0.5Zr0.5O2 Ferroelectric Technologies Using NH3 Plasma and Microwave Annealing

    Chen, Y. H., Su, C-J., Yang, T-H., Hu, C. & Wu, T-L., Apr 2020, In : IEEE Transactions on Electron Devices. 67, 4, p. 1581-1585 5 p.

    Research output: Contribution to journalArticle

  • Investigation of recessed gate AlGaN/GaN MIS-HEMTs with double AlGaN barrier designs toward an enhancement-mode characteristic

    Wu, T-L., Tang, S. W. & Jiang, H. J., Feb 2020, In : Micromachines. 11, 2, 163.

    Research output: Contribution to journalArticle

    Open Access
  • Prizes

    Fellow of the Higher Education Academy (FHEA)

    Wu, Tian-Li (Recipient), Apr 2020

    Prize: Honorary award

    Imec Ph.D. Fellowship

    Wu, Tian-Li (Recipient), Jun 2012

    Prize

    MediaTek Junior Chair Professor

    Wu, Tian-Li (Recipient), 2017

    Prize: Honorary award

    MOST Young Scholar Fellowship

    Wu, Tian-Li (Recipient), Feb 2019

    Prize

    NCTU Outstanding Graduate Mentorship Award

    Wu, Tian-Li (Recipient), Jul 2020

    Prize: Honorary award