1982 …2020

Research output per year

If you made any changes in Pure these will be visible here soon.

Research Output


Substrate bias dependence of breakdown progression in ultrathin oxide pMOSFETs

Tsai, C. W., Chen, M. C., Gu, S. H. & Wang, T-H., 1 Apr 2003, In : IEEE Electron Device Letters. 24, 4, p. 269-271 3 p.

Research output: Contribution to journalLetter

5 Scopus citations