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Letter
2003

Substrate bias dependence of breakdown progression in ultrathin oxide pMOSFETs

Tsai, C. W., Chen, M. C., Gu, S. H. & Wang, T-H., 1 Apr 2003, In : IEEE Electron Device Letters. 24, 4, p. 269-271 3 p.

Research output: Contribution to journalLetter

5 Scopus citations