1982 …2020

Research output per year

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Research Output

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2004

A temperature accelerated model for high state retention loss of nitride storage flash memory

Lee, M. Y., Zous, N. K., Huang, T., Tsai, W. J., Kuo, A., Wang, T-H., Yin, S. & Lu, C. Y., 1 Dec 2004, p. 11-14. 4 p.

Research output: Contribution to conferencePaper

2 Scopus citations

Comparison of copper interconnect electromigration behaviors in various structures for advanced BEOL technology

Lin, M. H., Lin, Y. L., Yang, G. S., Yeh, M. S., Chang, K. P., Su, K. C. & Wang, T-H., 1 Dec 2004, p. 177-180. 4 p.

Research output: Contribution to conferencePaper

2 Scopus citations

Comparison of oxide breakdown progression in ultra-thin oxide SOI and bulk pMOSFETs

Chan, C. T., Kuo, C. H., Tang, C. J., Chen, M. C., Wang, T-H., Lu, S. H., Hu, H. C., Chen, T. F., Yang, C. K., Lee, M. T., Wu, D. Y., Chen, J. K., Chien, S. C. & Sun, S. W., 1 Dec 2004, p. 49-52. 4 p.

Research output: Contribution to conferencePaper

Hot carrier degradation in LDMOS power transistors

Cheng, C. C., Wu, J. W., Lee, C. C., Shao, J. H. & Wang, T-H., 1 Dec 2004, p. 283-286. 4 p.

Research output: Contribution to conferencePaper

10 Scopus citations

Mechanism for slow programming in advanced low-voltage, high-speed ferroelectric memory

Lai, S. C., Tsai, C. W., Yen, C. T., Liu, C. L., Lee, S. Y., Lien, H. M., Lung, S. L., Chien, C-H., Wu, T. B., Wang, T-H., Liu, R. & Lu, C. Y., 1 Dec 2004, p. 123-126. 4 p.

Research output: Contribution to conferencePaper

Relationship between AC stress and DC stress on tunnel oxides

Zous, N. K., Chen, Y. J., Chin, C. Y., Tsai, W. J., Lu, T. C., Chen, M. S., Lu, W. P., Wang, T-H., Pan, S. C., Ku, J. & Lu, C. Y., 1 Dec 2004, p. 119-121. 3 p.

Research output: Contribution to conferencePaper

Reliability and device scaling challenges of trapping charge flash memories

Yeh, C. C., Tsai, W. J., Lu, T. C., Liao, Y. Y., Zous, N. K., Chen, H. Y., Wang, T-H., Ting, W., Ku, J. & Lu, C. Y., 1 Dec 2004, p. 247-250. 4 p.

Research output: Contribution to conferencePaper

5 Scopus citations
2003

Reliable extraction of interface states from charge pumping method in ultra-thin gate oxide MOSFET's

Lai, H. C., Zous, N. K., Tsai, W. J., Lu, T. C., Wang, T-H., King, Y. C. & Pan, S., 21 Jul 2003, p. 99-102. 4 p.

Research output: Contribution to conferencePaper

7 Scopus citations
1995

Interface trap induced drain leakage current in various n-MOSFET structures

Chang, T. E., Wang, T-H. & Huang, C., 1 Dec 1995, p. 291-294. 4 p.

Research output: Contribution to conferencePaper

1 Scopus citations
1994

Analysis of interface state induced performance variation in LDD MOSFET's

Wang, T-H., Huang, C., Chou, P. C., Chung, S. S. & Chang, T. E., 1 Jan 1994.

Research output: Contribution to conferencePaper

Lateral field enhanced band-trap-band tunneling current in a 0.5 μm "OFF" state MOSFET

Wang, T-H., Huang, C., Chang, T. E., Chou, J. W. & Chang, C. Y., 1 Jan 1994.

Research output: Contribution to conferencePaper

1992

Quantum well geometrical effects on two-dimensional electron mobility in AlGaAs/GaAs hetero-structures

Wang, T-H., Hsieh, T. H. & Chen, T. W., 1 Dec 1992, p. 307-309. 3 p.

Research output: Contribution to conferencePaper