1982 …2020

Research output per year

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Research Output


Statistical characterization of BTI-induced high-k dielectric traps in nanoscale transistors

Wang, T-H., Chiu, J. P. & Liu, Y. H., 1 Jul 2014, Bias Temperature Instability for Devices and Circuits. Springer New York, Vol. 9781461479093. p. 53-74 22 p.

Research output: Chapter in Book/Report/Conference proceedingChapter