1982 …2020

Research output per year

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Projects

Active

Frequency Response and Reliability in Negative Capacitance FET

Wang, T.

1/08/2031/07/21

Project: Government MinistryMinistry of Science and Technology

Accelerating Qualification Method for Data Retention in Post-SET/RESET Cycling RRAM and its Theory and Statistical Models.

Wang, T.

1/08/2031/07/21

Project: Government MinistryMinistry of Science and Technology

Finished

Frequency Response and Reliability in Negative Capacitance FET

Wang, T.

1/08/1931/07/20

Project: Government MinistryMinistry of Science and Technology

Accelerating Qualification Method for Data Retention in Post-SET/RESET Cycling RRAM and its Theory and Statistical Models.

Wang, T.

1/08/1931/07/20

Project: Government MinistryMinistry of Science and Technology

3D V-NAND Reliability Characterization and SiN Charge Transport

Wang, T.

1/08/1831/07/19

Project: Government MinistryMinistry of Science and Technology

New Failure Modes, Statistical Characterization and 3D Reliability

Wang, T.

1/08/1731/10/18

Project: Government MinistryMinistry of Science and Technology

3D V-NAND Reliability Characterization and SiN Charge Transport

Wang, T.

1/08/1731/07/18

Project: Government MinistryMinistry of Science and Technology

New Failure Modes, Statistical Characterization and 3D Reliability

Wang, T.

1/08/1631/10/17

Project: Government MinistryMinistry of Science and Technology

3D V-NAND Reliability Characterization and SiN Charge Transport

Wang, T.

1/08/1631/07/17

Project: Government MinistryMinistry of Science and Technology

New Failure Modes, Statistical Characterization and 3D Reliability

Wang, T.

1/08/1531/10/16

Project: Government MinistryMinistry of Science and Technology

Single Charge Phenomena, Scaling Physical Mechanisms and Innovations in Nano-Scale SONOS Flash Memory

Wang, T.

1/08/1231/07/13

Project: Government MinistryMinistry of Science and Technology

Quasi-Ballistic Transport Simulation and Reliability in Si,Ge,GaAs Nano-CMOS Devices Including Quantum-Wire Structures

Wang, T.

1/08/1231/07/13

Project: Government MinistryMinistry of Science and Technology

Quasi-Ballistic Transport Simulation and Reliability in Si,Ge,GaAs Nano-CMOS Devices Including Quantum-Wire Structures

Wang, T.

1/08/1131/07/12

Project: Government MinistryMinistry of Science and Technology

Single Charge Phenomena, Scaling Physical Mechanisms and Innovations in Nano-Scale SONOS Flash Memory

Wang, T.

1/08/1131/07/12

Project: Government MinistryMinistry of Science and Technology

Single Charge Phenomena, Scaling Physical Mechanisms and Innovations in Nano-Scale SONOS Flash Memory

Wang, T.

1/08/1031/07/11

Project: Government MinistryMinistry of Science and Technology

Quasi-Ballistic Transport Simulation and Reliability in Si,Ge,GaAs Nano-CMOS Devices Including Quantum-Wire Structures

Wang, T.

1/08/1031/07/11

Project: Government MinistryMinistry of Science and Technology

次32奈米CMOS元件可靠性分析,量子結構效應,與蒙地卡羅電荷傳輸模擬(3/3)

Wang, T.

1/08/0931/07/10

Project: Government MinistryMinistry of Science and Technology

次32奈米CMOS元件可靠性分析,量子結構效應,與蒙地卡羅電荷傳輸模擬(2/3)

Wang, T.

1/08/0831/07/09

Project: Government MinistryMinistry of Science and Technology

次50奈米二位元儲存氮化矽快閃式記憶體元件之結構、電荷傳輸與可靠性研究(3/3)

Wang, T.

1/08/0831/07/09

Project: Government MinistryMinistry of Science and Technology