Bing-Yue Tsui

Professor

Institute of Electronics

https://orcid.org/0000-0003-2963-8211

Phone03-5731570
Emailbytsui@mail.nctu.edu.tw
Websitehttp://www.ee.nctu.edu.tw/People/Professor/individual.php?index=37

Research output per year

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Personal profile

Research Interests

Semiconductor Physics & Devices, IC Technologies, Electrical Characterization Measurement & Analyses

Experience

Education/Academic qualification

PhD, National Chiao Tung University

External positions

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Recent external collaboration on country level. Dive into details by clicking on the dots.

1 Active
27 Finished

SiC CMOS Device and IC Process Technology
Tsui, B.
1/05/20 → 30/04/21
Project: Government Ministry › Ministry of Science and Technology
SiC CMOS Device and IC Process Technology
Tsui, B.
1/05/19 → 30/04/20
Project: Government Ministry › Ministry of Science and Technology
碳化矽單晶片功率系統平台-大型儀器(總計畫)-碳化矽蝕刻系統(碳化矽互補式金氧半場效應電晶體元件與積體電路製程技術)
Tsui, B.
1/05/18 → 30/04/19
Project: Government Ministry › Ministry of Science and Technology
SiC CMOS Device and IC Process Technology
Tsui, B.
1/05/18 → 30/04/19
Project: Government Ministry › Ministry of Science and Technology
Service Proposal for Precious Instruments of National Chiao-Tung University
Tsui, B.
1/12/17 → 30/04/19
Project: Government Ministry › Ministry of Science and Technology

101 Article
48 Conference contribution
11 Paper
6 Patent
More

Degradation Mechanism of Ge N⁺-P Shallow Junction with Thin GeSn Surface Layer
Tsui, B. Y., Liao, H. H. & Chen, Y. J., Mar 2020, In: IEEE Transactions on Electron Devices. 67, 3, p. 1120-1125 6 p., 8964438.
Research output: Contribution to journal › Article › peer-review
Demonstration of CMOS Integration with High-Voltage Double-Implanted MOS in 4H-SiC
Jiang, J. Y., Hung, J. C., Lo, K. M., Huang, C. F., Lee, K. Y. & Tsui, B. Y., 2020, (Accepted/In press) In: Ieee Electron Device Letters.
Research output: Contribution to journal › Article › peer-review
Digital Logic and Asynchronous Datapath with Heterogeneous TFET-MOSFET Structure for Ultralow-Energy Electronics
Hung, J. H., Wang, P. Y., Lo, Y. C., Yang, C. W., Tsui, B. Y. & Yang, C. H., 2020, (Accepted/In press) In: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits.
Research output: Contribution to journal › Article › peer-review

Open Access
Extraction of Ultra-Low Contact Resistivity by End-Resistance Method
Tsui, B-Y., Lee, Y. H., Wu, D. Y., Lee, Y. J. & Li, M. Y., May 2020, 2020 IEEE 33rd International Conference on Microelectronic Test Structures, ICMTS 2020 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 9107910. (IEEE International Conference on Microelectronic Test Structures; vol. 2020-May).
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
Mechanism of Degradation of Ge NMOSFET with Channel Ion Implantation and Its Recovery
Tsui, B. Y., Chang, Y. C. & Chen, Y. J., Aug 2020, 2020 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA 2020. Institute of Electrical and Electronics Engineers Inc., p. 74-75 2 p. 9203673. (2020 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA 2020).
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review