Projects per year
Personal profile
Research Interests
Semiconductor Physics & Devices, IC Technologies, Electrical Characterization Measurement & Analyses
Experience
Education/Academic qualification
PhD, National Chiao Tung University
External positions
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Network
Recent external collaboration on country level. Dive into details by clicking on the dots.
Projects
SiC CMOS Device and IC Process Technology
1/05/20 → 30/04/21
Project: Government Ministry › Ministry of Science and Technology
SiC CMOS Device and IC Process Technology
1/05/19 → 30/04/20
Project: Government Ministry › Ministry of Science and Technology
碳化矽單晶片功率系統平台-大型儀器(總計畫)-碳化矽蝕刻系統(碳化矽互補式金氧半場效應電晶體元件與積體電路製程技術)
1/05/18 → 30/04/19
Project: Government Ministry › Ministry of Science and Technology
SiC CMOS Device and IC Process Technology
1/05/18 → 30/04/19
Project: Government Ministry › Ministry of Science and Technology
Service Proposal for Precious Instruments of National Chiao-Tung University
1/12/17 → 30/04/19
Project: Government Ministry › Ministry of Science and Technology
Research Output
Degradation Mechanism of Ge N+-P Shallow Junction with Thin GeSn Surface Layer
Tsui, B. Y., Liao, H. H. & Chen, Y. J., Mar 2020, In : IEEE Transactions on Electron Devices. 67, 3, p. 1120-1125 6 p., 8964438.Research output: Contribution to journal › Article
Extraction of Ultra-Low Contact Resistivity by End-Resistance Method
Tsui, B. Y., Lee, Y. H., Wu, D. Y., Lee, Y. J. & Li, M. Y., May 2020, 2020 IEEE 33rd International Conference on Microelectronic Test Structures, ICMTS 2020 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 9107910. (IEEE International Conference on Microelectronic Test Structures; vol. 2020-May).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
Photon-Detection-Probability Simulation Method for CMOS Single-Photon Avalanche Diodes
Hsieh, C. A., Tsai, C. M., Tsui, B. Y., Hsiao, B. J. & Lin, S. D., 13 Jan 2020, In : Sensors (Switzerland). 20, 2, 436.Research output: Contribution to journal › Article
Open Access
Reduction of Contact Resistivity by Nano-Textured Contact
Tsui, B. Y., Lee, Y. H. & Lee, C. Y., 2020, (Accepted/In press) In : Journal of Electronic Materials.Research output: Contribution to journal › Article
Schottky barrier diodes isolated by local oxidation of SiC (LOCOSiC) using pre-amorphization implantation technology
Cheng, J. C., Lee, J. E. & Tsui, B-Y., Sep 2020, In : Solid-State Electronics. 171, 107834.Research output: Contribution to journal › Article