Spherical Aberration Corrected Scanning Transmission Electron Microscope

    Li Chang (Manager) & 淳瑜 高 (Operator)

Equipment/facility: Equipment

  • Location

    基礎大樓SC022室

    Taiwan

Equipments Details

Description

儀器重要規格: (1) 加速電壓:200 kV. (2) 電子槍系統:Schottky Field Emission Gun (FEG). (3) 解析度(200kV):
TEM Lattice resolution:0.072 nm
TEM Point resolution:0.190 nm
TEM Optical information limit:0.107 nm
HRTEM mode (UHR pole piece, Cs = 0.5 mm, Cc = 1.1 mm)
STEM BF image resolution:0.136 nm
STEM HAADF image resolution:0.082 nm
STEM aberration free area angle:36.63 mrad. (4) 雙傾斜試片座其試片傾斜角度:正負25度. (5) STEM球像差修正器(Spherical aberration Corrector). (6) STEM BF/HAADF檢測器(High Angle Annual Dark Field Detector). (7) X光能量散佈分析儀(EDS) : Si drift detector (SDD), Energy resolution 127eV。

服務項目:
TEM明視野影像(Bright Field)、高分辨影像(HRTEM)、STEM影像(ABF/HAADF);不提供直接擇區繞射圖形(SAD)之儲存,但可儲存經由軟體處理轉換的繞射圖形。奈米尺寸之X光EDS能譜(B5~U92),STEM包含EDS Point ID/Line Scan/Mapping。
Photo associated with equipment

Details

NameJEOL ARM200F
Acquisition date1/12/11
ManufacturersJEOL Ltd.

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