SCANNING ELECTRON MICROSCOPE

Equipment/facility: Equipment

  • Location

    工程六館211室

    Taiwan

Equipments Details

Description

重要規格: (1) 解析力:0.7nm (15kV), 0.7nm( 1kV). (2) In-Lens. (3) Schottky Plus Field Emission Electron Gun. (4)Gun Vacuum:10-7 Pa or higher. (5) 倍率:x25 to x1,000,000. (6) 加速電壓:0.1V to 30kV

服務項目:
影像觀察及照相: (1) SEI (Scanning Electron Image). (2) BEI . (3)(Backscattered Electron Image). (4) EDS (Energy Dispersive X-ray Spectrometer). (5) EBSD(Electron Backscatter Diffraction Analysis)
Photo associated with equipment

Details

NameJEOL JSM-7800F PRIME+ EDS Oxford MAX150 and EBSD NordlysMax3
Acquisition date1/01/16
ManufacturersJEOL Ltd.

Fingerprint

Explore the research areas in which this equipment has been used. These labels are generated based on the related outputs. Together they form a unique fingerprint.