Equipments Details
Description
重要規格:用途: 奈米材料及半導體奈米結構之微拉曼散射量測系統
光譜儀規格: (1) Double monochromator with 2 plane holographic gratings. (2) F/8 aperture. (3) Number of grooves/mm 1800. (4) Resolution: 0.15 cm-1 on the Hg line at 5791Å. (5) Dispersion 9.2cm-1/mm at 514.5nm (2.43Å/mm)
空間解析度: 2μm
服務項目:奈米材料及半導體奈米結構之微拉曼散射量測系統
光譜儀規格: (1) Double monochromator with 2 plane holographic gratings. (2) F/8 aperture. (3) Number of grooves/mm 1800. (4) Resolution: 0.15 cm-1 on the Hg line at 5791Å. (5) Dispersion 9.2cm-1/mm at 514.5nm (2.43Å/mm)
空間解析度: 2μm
服務項目:奈米材料及半導體奈米結構之微拉曼散射量測系統
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Details
| Name | Olympus IX 70顯微鏡 + Jobin-Yvon U1000光譜儀 |
|---|---|
| Manufacturers | Olympus Corporation, Jobin-Yvon |