Equipments Details
Description
重要規格： (1) 可切換式光源
(Bragg Brentano/ Parallel Beam). (2) 可切換式偵測器
(Scintillator/Vantec-1 detector). (3) 超低溫樣品量測系統
(12 K – 300 K)
服務項目： (1) 粉末樣品：廣角繞射(WAG). (2) 單晶樣品：廣角繞射(WAG)、Rocking Curve. (3) 薄膜樣品：廣角繞射(WAG)、低掠角薄膜繞射(GIXRD)、Rocking Curve
(Bragg Brentano/ Parallel Beam). (2) 可切換式偵測器
(Scintillator/Vantec-1 detector). (3) 超低溫樣品量測系統
(12 K – 300 K)
服務項目： (1) 粉末樣品：廣角繞射(WAG). (2) 單晶樣品：廣角繞射(WAG)、Rocking Curve. (3) 薄膜樣品：廣角繞射(WAG)、低掠角薄膜繞射(GIXRD)、Rocking Curve
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Details
| Name | D8 Discover X-ray Diffraction System |
|---|---|
| Acquisition date | 1/07/13 |
| Manufacturers | Bruker |
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