High performance low temperature and multi-function X-ray diffractometer

Department of Electrophysics

Equipment/facility: Equipment

  • Location

    基礎大樓SC026室

    Taiwan

Equipments Details

Description

重要規格： (1) 可切換式光源
(Bragg Brentano/ Parallel Beam). (2) 可切換式偵測器
(Scintillator/Vantec-1 detector). (3) 超低溫樣品量測系統
(12 K – 300 K)

服務項目： (1) 粉末樣品：廣角繞射(WAG). (2) 單晶樣品：廣角繞射(WAG)、Rocking Curve. (3) 薄膜樣品：廣角繞射(WAG)、低掠角薄膜繞射(GIXRD)、Rocking Curve

Details

NameD8 Discover X-ray Diffraction System
Acquisition date1/07/13
ManufacturersBruker

Contact Information

NameChih-Wei Luo
Phone黃育立 先生 TEL:03-5712121ext56144
Emailshuangyulih@nctu.edu.tw
Web addressesWebsite, Booking/Management

Terms of loan/booking

Available for loan - internal and external

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