High performance low temperature and multi-function X-ray diffractometer

Equipment/facility: Equipment

  • Location

    基礎大樓SC026室

    Taiwan

Equipments Details

Description

重要規格: (1) 可切換式光源
(Bragg Brentano/ Parallel Beam). (2) 可切換式偵測器
(Scintillator/Vantec-1 detector). (3) 超低溫樣品量測系統
(12 K – 300 K)

服務項目: (1) 粉末樣品:廣角繞射(WAG). (2) 單晶樣品:廣角繞射(WAG)、Rocking Curve. (3) 薄膜樣品:廣角繞射(WAG)、低掠角薄膜繞射(GIXRD)、Rocking Curve

Details

NameD8 Discover X-ray Diffraction System
Acquisition date1/07/13
ManufacturersBruker

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